New work item proposal, NP
New work item proposal (NP) är termen som används inom IEC för nya förslag på standardiseringsprojekt.
Är du intresserad av att delta eller få ytterligare information om nya standardiseringsförslag, kontakta SEK kansli på senc@elstandard.se eller telefon 08-444 14 00.
Förslagen kan beställas kostnadsfritt från SEK Svensk Elstandard via formuläret nedan. Antalet kostnadsfria standardiseringsförslag är begränsat till tre. Vid beställning av fler än tre förslag tas en avgift på 300 kr/förslag.
| Benämning IEC | Benämning CLC | Titel | SEK grupp | Deadline |
|---|---|---|---|---|
| 32C/683/NP | PNW 32C-683 ED1: Fire-extinguishing thermal-links | TC 32/SC 32C | 2026-07-02 | |
| 115/441/NP | PNW TS 115-441 ED1: Specification of Functional Performance of Grid-forming VSC-HVDC systems | TC 115 | 2026-07-02 | |
| 47E/895/NP | PNW 47E-895 ED1: Semiconductor devices - Part 14-15: Semiconductor sensors - Performance test method of dynamic vision sensors | TC 47/SC 47E | 2026-07-02 | |
| 8A/229/NP | PNW TS 8A-229 ED1: Interconnection of converter-based resources with power systems - Part 2: General requirements for marine energy generation | TC 8/SC 8A | 2026-07-09 | |
| 47/3017/NP | PNW 47-3017 ED1: Semiconductor device - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 3: Test method for defects using scanning electron microscopy | TC 47 | 2026-07-09 | |
| 47/3016/NP | PNW 47-3016 ED1: Semiconductor device - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 2: Test method for defects using optical microscopy | TC 47 | 2026-07-09 | |
| JTC1-SC43/208/NP | PNW JTC1-SC43-208 ED1: Information technology - Brain-computer Interfaces - Framework for fusion and quality profiling of Non-Invasive BCI data | ISO/IEC JTC 1/SC 43 | 2026-07-09 | |
| 51/1618/NP | PNW 47-3016 ED1: Semiconductor device - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 2: Test method for defects using optical microscopy | TC 51 | 2026-07-09 | |
| JTC1-SC25/3361/NP | PNW TS JTC1-SC25-3361 ED1: Information technology – Generic cabling systems – Part 100: Classification of optical fibre channels | ISO/IEC JTC 1/SC 25 | 2026-07-16 | |
| 47F/555/NP | PNW 47F-555 ED1: Semiconductor devices - Micro-electromechanical devices - Part 65: Test methods for electrical stimulation environment and Electrophysiological measurement using 3D Cell-tissues Models with MEMS chips | TC 47/SC 47F | 2026-07-16 | |
| 69/1136/NP | PNW 69-1136 ED1: Standard interface for connecting charging stations to local energy management systems - Part 4-1: Test specifications (Use Cases) | TC 69 | 2026-07-30 | |
| 77C/365/NP | PNW 77C-365 ED1: IEC 61000-2-X: Electromagnetic Compatibility (EMC) – Part 2-X: Environment – Description of Geomagnetic Disturbance (GMD) environment - Radiated and Conducted disturbance. | TC 77/SC 77C | 2026-08-06 | |
| 8B/289/NP | PNW TS 8B-289 ED1: Decentralized multi-energy systems - Integration of Power-to-X (P2X) systems into decentralized energy systems - Part 2-1: General principles, framework, and use cases | TC 8/SC 8B | 2026-08-06 | |
| 9/3355/NP | PNW 9-3355 ED1: Railway applications - Fixed installations - Requirements for the validation of simulation tools used for the design of electric traction power supply systems | TC 9 | 2026-07-09 | |
| CIS/H/565/NP | PNW CIS/H-565 ED1: Electromagnetic compatibility (EMC) – Part 6-9: Generic standards – Emission standard for equipment in low Earth orbit | CISPR/CIS/H | 2026-08-06 | |
| 82/2635/NP | PNW 82-2635 ED1: Photovoltaic cells – Part 10：Measurement of photoluminescence imaging of crystalline silicon solar cells | TC 82 | 2026-07-16 | |
| 62/590/NP | PNW 62-590 ED1: Evaluation of pre-trained AI models for use within a medical device | TC 62 | 2026-08-13 | |
| SyCSM/135/NP | PNW TS SYCSM-135 ED1: Key Performance Aspects for Smart Manufacturing | SyC SM | 2026-08-13 | |
| 8B/293/NP | PNW TS 8B-293 ED1: Virtual Power Plant - Part 4: Primary Frequency Regulation Functional Requirements and Specification | TC 8/SC 8B | 2026-08-13 | |
| 47/3019/NP | PNW 47-3019 ED1: General Method for Calculating the Carbon Footprint of Semiconductor Products up to the Manufacturing Process | TC 47 | 2026-08-13 | |
| 72/1547/NP | PNW 72-1547 ED1: Automatic electrical controls -Part 2-xx: Particular requirements for speech recognition devices | TC 72 | 2026-08-27 | |
| SyCSmartCities/435/NP | PNW TS SYCSMARTCITIES-435 ED1: Smart city system Ontology -- Part 3: Ontology-associated interoperability for smart city | SyC Smart Cities | 2026-08-27 | |
| 23E/1423/NP | PNW 23E-1423 ED1: Test method for RCDs of different types connected in series in household and similar uses | TC 23/SC 23E | 2026-08-27 | |
| SyCSmartEnergy/349/NP | PNW SRD SyCSmartEnergy-349 ED1: Energy flexibility and residential demand side response – Part 1: Common ground | SyC Smart Energy | 2026-08-27 | |
| 111/896/NP | PNW 111-896 ED1: Determination of certain substances in electrotechnical products - Part 16: Benzotriazole ultraviolet absorbers in plastics by Gas chromatography-mass spectrometry (GC-MS) | TC 111 | 2026-08-27 |
Visa2550100
SEK Svensk Elstandard
Post: Box 1042, 172 21 Sundbyberg
Besök: Englundavägen 7D, 171 41 Solna
E-post: sek@elstandard.se
Tel: 08-444 14 00
Members of
Faställer all svensk standard inom elområdet | Copyright 2026 © SEK Svensk Elstandard